Unidirectional magnetoresistance in magnetic thin films with non-uniform thickness
نویسندگان
چکیده
منابع مشابه
Precise Measurement of Thickness Distribution of Non- Uniform Thin Films by Imaging Spectroscopic Reflectometry
− A new method of imaging spectroscopic photometry enabling us to perform the complete optical characterization of thin films exhibiting area non-uniformity in optical parameters is presented. An original imaging spectroscopic photometer operating in the reflection mode at normal incidence is used to apply this method. A CCD camera serves as a detector in this photometer. Therefore the spectral...
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ژورنال
عنوان ژورنال: AIP Advances
سال: 2018
ISSN: 2158-3226
DOI: 10.1063/1.5007691